Holoeye空間光調(diào)制器 | ALPAO高速變形鏡 | 波前分析儀Phasics | 自適應(yīng)光學(xué)系統(tǒng) | 數(shù)字微反射鏡 DMD 數(shù)字微鏡器件 | 光學(xué)元件器件DOE |
光刻儀 |
飛秒激光器 | 皮秒激光器 | 自相關(guān)儀 | 超短脈沖測(cè)量?jī)xFrog | 超快激光器件 |
高功率連續(xù)波OPO | 高功率光纖激光器 | Qioptiq NANO 激光器 | 低噪聲窄線寬激光器 | 可調(diào)諧激光器 | 半導(dǎo)體激光器和放大器 | SLD和ASE寬帶光源 | 雙波長(zhǎng)輸出氦氖激光器 |
QIOPTIQ光纖耦合半導(dǎo)體激光器 | Diode & DPSS_qioptiq | 激光驅(qū)動(dòng)白光光源 | 等離子體寬帶光源 | 單色儀 | 光譜儀 | 光柵 | 輻射計(jì) | 防嗮系數(shù)分析 | Optogma固體激光器 | Solarlight | 波長(zhǎng)選擇器 |
激光準(zhǔn)直儀 | 紅外激光觀察鏡 | 激光功率能量計(jì) | 光學(xué)斬波器 | 光束質(zhì)量分析儀 | 位敏探測(cè)器 | 紅外相機(jī) | O/E轉(zhuǎn)換模塊探測(cè)器 TIA-525S |
太赫茲相機(jī)及源 | 太赫茲探測(cè)器 | 太赫茲元器件及晶體 | 太赫茲光譜儀 | 太赫茲功率計(jì) |
Optiphase | 微光MOI |
普克爾盒/Pockels Cells | 電光調(diào)制器/Electro-Optics Modulators | 法拉第隔離器/Faraday Isolators | SESAM半導(dǎo)體可飽和吸收鏡 | 探測(cè)器 | EOT高速光電探測(cè)器 | 其他未分類 |
電化學(xué)ECV 擴(kuò)散濃度 | 接觸電阻測(cè)量?jī)x | 四點(diǎn)探針測(cè)試儀 | 少子壽命測(cè)試儀 |
平行光管 |
光纖跳線及配件 | 無源器件 |
Product Overview
The cell test family of instruments has been
designed to have the highest possible accuracy for measuring high-efficiency silicon solar cells. This is accomplished using a patented multiflash technology.
The standard analysis includes the commonly reported parameters for cell testers, but is supplemented with the Suns-Voc analysis that precisely indicates the source of power loss due to shunt and series resistance effects. The CCT family of concentrator testers allows the user to view the efficiency versus intensity curves and light I-V curves at multiple intensities based on a short automated series of measurements.
System Capabilities
Available instruments:
The instrument interface displays both I-V and Suns-Voc data. This permits quick identification of shunt and series resistance effects.
larger view
The uniformity of the FCT-350 is Class A (??%) over 156 mm x 156 mm.
larger view
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One-sun cell flash testing (FCT)
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30-sun medium concentration cell testing (CCT)
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1000-sun high concentration cell testing (HCCT)
Analysis techniques:
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Suns-Voc curve
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3-point production testing utilizing Suns-Voc, Jsc, Vload
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Family of I-V curves versus intensity
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Efficiency versus intensity characteristic